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Reformatting test patterns for testing embedded core based system using test access mechanism (TAM) switch [SoC]

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5 Author(s)
Basu, S. ; Mukhopadhay, D. ; Roychoudhury, D. ; Sengupta, I.
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In this paper, a new algorithm for reformatting the test vector of system on chip (SOC) with test access mechanism (TAM) has been proposed. Exhaustive experimentation has been conducted by employing random reformatted test vectors for a variety of SOCs, constructed with the ISCAS sequential benchmark circuits. For a limited number of input pins, which have been provided for testing the SOC, the proposed algorithm drastically reduces the test-time as well as the hardware

Published in:
Design Automation Conference, 2002. Proceedings of ASP-DAC 2002. 7th Asia and South Pacific and the 15th International Conference on VLSI Design. Proceedings.

Date of Conference: 2002

Page(s):
598 - 603
Meeting Date :
07 Jan 2002-11 Jan 2002
Print ISBN:
0-7695-1441-3
INSPEC Accession Number:
7253835
Conference Location :
Bangalore
Digital Object Identifier :
10.1109/ASPDAC.2002.995001
Product Type:
Conference Publications

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