By Topic

Cycle-accurate energy measurement and characterization with a case study of the ARM7TDMI [microprocessors]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Naehyuck Chang ; Sch. of Comput. Sci. & Eng., Seoul Nat. Univ., South Korea ; Kwanho Kim ; Hyung Gyu Lee

Energy characterization is the basis for high-level energy reduction. Measurement-based characterization is accurate and independent of model availability and is thus suitable for commercial off-the-shelf (COTS) components, but conventional measurement equipment has serious limitations in this context. We introduce a new technique for the energy characterization of a microprocessor using a cycle-accurate energy measurement system based on charge transfer which is robust to spiky noise and is able to collect a range of energy consumption profiles in real time. It measures the energy variation of the CPU core by changing the instruction-level energy-sensitive factors such as opcodes (operations), instruction fetch addresses, register numbers, register values, data fetch addresses and immediate operand values at each pipeline stage. Using the ARM7TDMI RISC processor as a case study, we observe that the energy contributions of most instruction-level energy-sensitive factors are orthogonal to the operations. We are able to characterize the energy variation, preserving all the effects of the energy-sensitive factors for various software methods of energy reduction. We also demonstrate applications of our measurement and characterization techniques.

Published in:

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on  (Volume:10 ,  Issue: 2 )