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Enhancing the static D.C. fault diagnosis of a Resistance Temperature Detector sensor circuit using equivalent fault analysis

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3 Author(s)
Worsman, M. ; Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., China ; Wong, M.W.T. ; Lee, Y.S.

Analysis of equivalent single parametric component faults in a Resistance-Temperature-Detector (RTD) sensor circuit under steady-state d.c. condition is used to systematically adjust component parameters for enhanced fault diagnosis. Component tolerances are accounted for when evaluating the effectiveness of the proposed changes

Published in:

Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on

Date of Conference:

2002