By Topic

Test data compression using don't-care identification and statistical encoding

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Kajihara, S. ; Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Japan ; Taniguchi, K. ; Pomeranz, I. ; Reddy, S.M.

This paper describes a method of test data compression for a given test set using statistical encoding. In order to maximize the effectiveness of statistical encoding, the method first converts some specified values of test vectors to unspecified ones without losing fault coverage, and then reassigns appropriate logic values to the unspecified inputs. Experimental results for ISCAS-89 benchmark circuits show that the proposed method could reduce test data volume to less than 40% of the original test sets

Published in:

Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on

Date of Conference:

2002