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A method of static test compaction based on don't care identification

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3 Author(s)
Miyase, K. ; Dept. of Comput. Sci. & Electron., Kyushu Inst. of Technol., Japan ; Kajihara, S. ; Reddy, S.M.

In this paper, we propose a procedure to compact a test set for a combinational circuit. Given a test set in which all input values are specified, the procedure first identifies don't care inputs of the test set, and next reassigns appropriate values to the don't cares to achieve test compaction. The procedure can be applied repeatedly, until further compaction cannot be derived. Experimental results show effectiveness of the proposed procedure for the ISCAS benchmark circuits

Published in:

Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on

Date of Conference:

2002