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Test socket chip for measuring dark currents in IR FPA

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3 Author(s)

A test socket chip for measuring dark currents of infrared (IR) detectors in a focal plane array (FPA) is presented in this paper. A calibration scheme adopted in this chip to cancel the leakage current due to OFF-state MOS switches tied to the measuring path is also demonstrated

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Electronic Design, Test and Applications, 2002. Proceedings. The First IEEE International Workshop on

Date of Conference: