Scheduled System Maintenance on May 29th, 2015:
IEEE Xplore will be upgraded between 11:00 AM and 10:00 PM EDT. During this time there may be intermittent impact on performance. We apologize for any inconvenience.
By Topic

Comparison of split-beam transducer geometries and excitation configurations for transrectal prostate HIFU treatments

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Seip, R. ; Focus Surg., Inc, Indianapolis, IN, USA ; Sanghvi, N.T. ; Uchida, T. ; Umemura, S.

Six split-beam transducer configurations have been examined using computer simulations and in-vitro experiments. The goal of this study was to identify a simple split-beam transducer configuration capable of reducing transrectal high intensity focused ultrasound (HIFU) prostate cancer treatment time without sacrificing treatment safety and efficacy. Lesion volume, lesion and rectal wall temperatures, sonication ON/OFF time, and total acoustic power parameters were used as comparison criteria. The most promising split-beam configuration generates necrosed tissue volumes 5 times larger than the single-element transducer with the same sonication time, while keeping maximum focal zone temperatures below 90°C. These parameters yield approximate overall treatment time reductions by a factor of 1.85 as compared to single-element transrectal HIFU PC treatments, mainly due to longer tissue cooling time required to maintain current safety levels

Published in:

Ultrasonics Symposium, 2001 IEEE  (Volume:2 )

Date of Conference:

2001