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Tracking of object with SVM regression

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4 Author(s)
Weiyu Zhu ; Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA ; Song Wang ; Ruei-Sung Lin ; Levinson, S.

This paper presents a novel feature-matching based approach for rigid object tracking. The proposed method models the tracking problem as discovering the affine transforms of object images between frames according to the extracted feature correspondences. False feature matches (outliers) are automatically detected and removed with a new SVM regression technique, where outliers are iteratively identified as support vectors with the gradually decreased insensitive margin ε. This method, in addition to object tracking, can also be used for general feature-based epipolar constraint estimation, in which it can quickly detect outliers even if they make up, in theory, over 50% of the whole data. We have applied the proposed method to track real objects under cluttering backgrounds with very encouraging results.

Published in:

Computer Vision and Pattern Recognition, 2001. CVPR 2001. Proceedings of the 2001 IEEE Computer Society Conference on  (Volume:2 )

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