A new methodology for reconstructing aperture fields from spherical surface data, with application to array antenna diagnostics

A novel algorithm for deriving diagnostics from spherical surface measurement data is described. In keeping with a 'black-box' testing rationale, no initial assumptions are made as to the properties of the antenna under test. Nevertheless, high-resolution reconstructions may be generated. In the case of planar array diagnosis, single element excitation faults may be quantified to an accuracy of 0.25 dB and 2 degrees .<
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