Referenced Items are not available for this document.
We propose several techniques to improve a simulation based test pattern generation procedure for sequential circuits. The effectiveness of the proposed techniques is demonstrated through experimental results on a large set of benchmark circuits
Published in:
Test Symposium, 2001. Proceedings. 10th Asian
Date of Conference: 2001
- Page(s):
- 82 - 87
- Meeting Date :
- 19 Nov 2001-21 Nov 2001
- ISSN :
- 1081-7735
- Print ISBN:
- 0-7695-1378-6
- INSPEC Accession Number:
- 7197223
- Conference Location :
- Kyoto
- Digital Object Identifier :
- 10.1109/ATS.2001.990264
- Product Type:
- Conference Publications
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