By Topic

Nonlinear effects of radio-frequency interference in operational amplifiers

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
F. Fiori ; Dept. of Electron., Politecnico di Torino, Italy ; P. S. Crovetti

In this brief, the susceptibility of operational amplifiers to radio frequency interference (RFI) is studied by a new analytical model. The proposed model, in particular, points out the dependence of the RFI induced dc offset voltage shift in operational amplifiers on design parameters and parasitics, giving both a good insight into the nonlinear mechanisms involved in the phenomenon and a support to integrated circuit designers in order to develop high immunity operational amplifiers. The validity of the proposed approach is discussed comparing model predictions with the results of computer simulations and experimental measurements

Published in:

IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications  (Volume:49 ,  Issue: 3 )