Cart (Loading....) | Create Account
Close category search window

Fabrication and electrical properties of lapped type of TMR heads for ∼50 Gb/in2 and beyond

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

17 Author(s)
Araki, S. ; Data Storage Technol. Center, TDK Corp., Nagano, Japan ; Sato, K. ; Kagami, T. ; Saruki, S.
more authors

Tunnel giant magnetoresistance (TMR) heads at ∼50 Gb/in2 have been fabricated using improved lapping process. Together with writer of 2.0 T pole materials, recording performance has been demonstrated at magnetic write width of 0.28 μm and magnetic read width of 0.18 μm. The resistance area product of final wafer data is around 5 Ω·μm2, with lead and contact resistance included, resulting in a final head resistance of around 200 Ω. The output voltage achieved for 1 mA bias current is 42 mV/μm, and the isolated pulses are stable. With a discrete preamplifier, the track density as measured by "747 curve" is 94 kTPI at a bit-error rate of 10-4 and the linear density is 508 kBPI, achieving an areal density of 48 Gb/in2. The noise analysis reveals that the noises come mainly from media and shot noise.

Published in:

Magnetics, IEEE Transactions on  (Volume:38 ,  Issue: 1 )

Date of Publication:

Jan. 2002

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.