By Topic

Picosecond electro-optic probing of high-speed integrated circuits using external GaAs tip

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Nagatsuma, T. ; NTT LSI Lab., Kanagawa, Japan ; Shinagawa, M.

External electro-optic sampling has been demonstrated on high-speed integrated circuits using a pulse-compressed mode-locked Nd:YAG laser and a sophisticated GaAs probe tip. The measurement at frequencies up to 40 GHz has been successfully performed with excellent voltage sensitivity of less than 3 mV/ square root (Hz).

Published in:

Electronics Letters  (Volume:27 ,  Issue: 21 )