Prediction of analog performance parameters using fast transient testing

In this paper, a fast transient testing methodology for predicting the performance parameters of analog circuits is presented. A transient test signal is applied to the circuit under (cut) test and the transient response of the circuit is sampled and analyzed to predict the circuit's performance parameters. An algorithm for generating the optimum transient test signal is presented. The methodology is demonstrated in a production environment using a low-power opamp. Result from production test data showed: 1) a ten times speedup in production testing; 2) accurate prediction of the performance parameters; and 3) a simpler test configuration.