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Build-in-self-test of a real time digital signal processing system

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3 Author(s)
Haipeng Yuan ; Dept. of Electron. Eng., Beijing Inst. of Technol., China ; Teng Long ; Yansheng Yue

A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing. It can integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered and the performance of the time domain processing test and frequency domain processing test are analysed

Published in:

Radar, 2001 CIE International Conference on, Proceedings

Date of Conference: