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Build-in-self-test of a real time digital signal processing system

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3 Author(s)
Haipeng Yuan ; Dept. of Electron. Eng., Beijing Inst. of Technol., China ; Teng Long ; Yansheng Yue

A new method of built-in self-test of a real time digital signal processor is offered. This method is a hybrid one of board-level testing and system-level testing. It can integrate system adjustment, on-line testing and off-line testing in one BIST architecture. The implementation of the BIST is offered and the performance of the time domain processing test and frequency domain processing test are analysed

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Radar, 2001 CIE International Conference on, Proceedings

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