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Characterizations of Gamma and negative binomial distributions [reliability application]

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2 Author(s)
Osaki, S. ; Hiroshima Univ., Japan ; Xin-xiang Li

Characterizations of gamma and negative binomial distributions are presented by using the conditional expectation. A necessary and sufficient condition is given in terms of the failure rate for each distribution. To illustrate the usefulness of the results, the authors discuss the mean residual-life of the gamma distribution

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Reliability, IEEE Transactions on  (Volume:37 ,  Issue: 4 )