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A practical approach to testing electronic equipment for susceptibility to AC line transients

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1 Author(s)
Buschke, H.A. ; Zenith Electron. Corp., Glenview, CA, USA

Modern electronic equipment is very susceptible to damage due to AC line transients. This paper describes a relatively simple procedure for testing the equipment for susceptibility to line transients and describes some low cost equipment for performing two types of simulated tests. The susceptibility of the equipment under test, based on the test results, is assessed

Published in:

Reliability, IEEE Transactions on  (Volume:37 ,  Issue: 4 )