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Design considerations and verification testing of an SEE-hardened quad comparator

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2 Author(s)
van Onno, N.W. ; Intersil Corp., Melbourne, FL, USA ; Doyle, Brent R.

Describes design considerations and single-event effect (SEE) testing results of a hardened quad comparator equivalent to the industry standard "139" device. The hardened part uses redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance

Published in:

Nuclear Science, IEEE Transactions on  (Volume:48 ,  Issue: 6 )

Date of Publication:

Dec 2001

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