Referenced Items are not available for this document.
Describes design considerations and single-event effect (SEE) testing results of a hardened quad comparator equivalent to the industry standard "139" device. The hardened part uses redundancy and hardened complementary BiCMOS processing to achieve improved SEE performance
Published in:
Nuclear Science, IEEE Transactions on
(Volume:48
,
Issue:
6
)
Date of Publication: Dec 2001
- Page(s):
- 1859 - 1864
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 7241471
- Digital Object Identifier :
- 10.1109/23.983143
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Dec 2001
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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