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Complex SEU signatures in high-speed analog-to-digital conversion

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10 Author(s)

The complex single-event upset (SEU) signatures produced, by high-speed analog-to-digital converter devices are analyzed to establish magnitude, duration, and pattern characteristics. Histograms and other descriptive summaries of event characteristics are identified and their use in performing system effects analysis is described

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IEEE Transactions on Nuclear Science  (Volume:48 ,  Issue: 6 )