By Topic

A comparison of charge transfer efficiency measurement techniques on proton damaged n-channel CCDs for the Hubble Space Telescope Wide-Field Camera 3

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
A. Waczynski ; Global Sci. & Technol., NASA Goddard Space Flight Center, Greenbelt, MD, USA ; E. J. Polidan ; P. W. Marshall ; R. A. Reed
more authors

We examine proton-damaged charge-coupled devices (CCDs) and compare the charge transfer efficiency (CTE) degradation using extended pixel edge response, first pixel response, and 55Fe X-ray measurements. CTEs measured on Marconi and Fairchild imaging sensors CCDs degrade similarly at all signal levels, though some of the Fairchild CCDs had a supplementary buried channel

Published in:

IEEE Transactions on Nuclear Science  (Volume:48 ,  Issue: 6 )