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Optimization of the temporal response of II-VI direct type semiconductor detectors for flat-panel pulsed X-ray imaging

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15 Author(s)
Giakos, G.C. ; Dept. of Electr. Eng., Akron Univ., OH, USA ; Guntupalli, R. ; Nemer, R. ; Odogba, J.
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The rising and falling edges of detected signal pulses have been measured utilizing X-ray ionization of a planar Cd1-xZnx Te system under different irradiation geometries, at different detector thicknesses, and applied electric fields. The experimental results of this study indicate that the time response of the CdZnTe based X-ray system is suitable for digital pulsed radiographic applications

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Instrumentation and Measurement, IEEE Transactions on  (Volume:50 ,  Issue: 6 )