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Jitter testing for gigabit serial communication transceivers

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3 Author(s)
Yi Cai ; Agere Syst., Allentown, PA, USA ; Laquai, B. ; Luehman, K.

Proper testing of transceivers requires the ability not only to measure generated jitter but also to inject in-band as well as out-of-band jitter for an appropriate receiver tolerance test. The article introduces a low-cost method to extend jitter testing to conventional external loop-back testing (looping the transmitted signal back to its own receiver) or golden device testing (using a known good device to test its link partner). The technique introduced is independent of test platforms

Published in:

Design & Test of Computers, IEEE  (Volume:19 ,  Issue: 1 )