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Analyzing and diagnosing interconnect faults in bus-structured systems

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3 Author(s)

Testing multimodule systems presents several challenges, particularly when systems use submicron technology. The authors propose strategies to diagnose interconnect faults in bus-structured systems using several models. We propose several methods and strategies for a diagnosis using different fault models, including those applicable to submicron technology. Besides defining new features, such as the logical extent of faults, we also propose a reduction strategy that permits 100% fault detection and identification (including fault location)

Published in:

Design & Test of Computers, IEEE  (Volume:19 ,  Issue: 1 )