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An artificial fingerprint device (AFD) module using poly-Si thin film transistors with logic LSI compatible process for built-in security

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5 Author(s)
Maeda, S. ; ULSI Dev. Center, Mitsubishi Electr. Corp., Itami, Japan ; Kuriyama, H. ; Ipposhi, T. ; Maegawa, S.
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An artificial fingerprint device module using polycrystalline silicon thin film transistors with logic LSI compatible process is proposed for securing a digital society. Substituting for actual fingerprint characteristics variation of polysilicon thin film transistors is utilized. The variation is random and offers unique, nonalterable, and nonduplicable numbers. Stable recognition operation based on the nature of polysilicon TFTs is suggested.

Published in:
Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International

Date of Conference: 2-5 Dec. 2001

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