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High-resolution OCDR for testing integrated-optical waveguides: dispersion-corrupted experimental data corrected by a numerical algorithm

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3 Author(s)
Kohlhaas, A. ; Tech. Univ. Hamburg, Germany ; Fromchen, C. ; Brinkmeyer, E.

A numerical algorithm is presented and applied to dispersion-corrupted experimental data taken by coherence domain reflectometric (OCDR) measurements. It results in a retrieval of micrometer resolution and an enhanced dynamic range. High-resolution OCDR measurements may be seriously impaired by dispersion effects in the waveguides under test and rugged source spectra. In the investigation (Ti:LiNbO3 single-mode waveguide, 16 mm long; superluminescent diode source at λ0=820 nm) the spatial resolution progressively deteriorates along the waveguide by about one order of magnitude (from 6 to 60 μm). The algorithm was applied to the experimental data and successfully removed the dispersive broadening of the signatures

Published in:

Lightwave Technology, Journal of  (Volume:9 ,  Issue: 11 )

Date of Publication:

Nov 1991

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