By Topic

Methodology for studying the impact of intrinsic stress on the reliability of the electroless Ni UBM structure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mitchell, D. ; ChipPAC Inc, Chandler, AZ, USA ; Guo, Y. ; Sarihan, V.

A methodology for evaluating the reliability and the impact of intrinsic stresses on the electroless Ni under bump metallurgy (UBM) structure is presented. The first part of this work will address the testing methodology, which uses a pressure sensing device to determine the intrinsic stress in Ni due to the plating process. An optical method is used to capture deformation in the sensing device due to the Ni plating process. A finite element model is then used to calculate the intrinsic stress in the Ni film using the deformation output from the optical measurements. The second part of this work will address a predictive model used to determine the reliability of applying intrinsic stress values to a low cost electroless Ni UBM structure during the bump formation and solder reflow process. The combined work of the testing and predictive methodology provides a more effective and accurate method of predicting the Ni UBM reliability

Published in:

Components and Packaging Technologies, IEEE Transactions on  (Volume:24 ,  Issue: 4 )