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Fault detection for linear analog IC-the method of short-circuit admittance parameters

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2 Author(s)
Feng Li ; Dept. of Electron. Eng., Fudan Univ., Shanghai, China ; Peng-Yung Woo

A fault detection method, i.e. the short-circuit admittance parameters method, for linear analog ICs is proposed in this paper. Only two voltage measurements at the ports of the circuit are suggested to decide whether the circuit is working normally. This method can be used to design automatic circuit fault detection equipment for technicians to decide whether there are any faults in linear analog circuits. The attractive merits of this method are component parameter tolerance and error reduction in measurement and calculation

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Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on  (Volume:49 ,  Issue: 1 )