By Topic

Fabrication and characterization of narrow-band Bragg-reflection filters in silicon-on-insulator ridge waveguides

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Murphy, T.E. ; Lincoln Lab., MIT, Lexington, MA, USA ; Todd Hastings, Jeffrey ; Smith, Henry I.

We describe the design, fabrication and measurement of an integrated-optical Bragg grating filter, operating at a freespace wavelength of 1543 nm, based upon a silicon-on-insulator (SOI) ridge waveguide. The measured spectral response for a 4-mm long grating has a bandwidth of 15 GHz (0.12 nm), and shows good agreement with theoretical predictions

Published in:

Lightwave Technology, Journal of  (Volume:19 ,  Issue: 12 )