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High-accuracy flush-and-scan software diagnostic

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1 Author(s)

The software technique presented operates over a wide range of defect modes to quickly and accurately diagnose the failing latch in a defective chain without special circuitry or pattern generation. The high-accuracy flush-and-scan software diagnostic technique localizes scan chain defects. Rather than using special tests or circuits, the flush-and-scan technique records the signatures of failures resulting from normal test patterns, and uses software simulations to locate defects. To identify a defective latch, this technique repeatedly simulates different loads (initializations) until the simulation results match those from the tester

Published in:

Design & Test of Computers, IEEE  (Volume:18 ,  Issue: 6 )