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Strategies for low-cost test

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3 Author(s)

More collaboration between EDA, semiconductor, and ATE industry segments can improve the manufacturing test environment. The authors discuss how these improvements can dramatically reduce the cost of test and lead to a new generation of DFT-aware ATE and ATE-aware DFT

Published in:

Design & Test of Computers, IEEE  (Volume:18 ,  Issue: 6 )