Cart (Loading....) | Create Account
Close category search window
 

Spatially and spectrally resolved imaging of a polycrystalline ZnO dots using near field optical technique

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Yatsui, T. ; ERATO, Japan Sci. & Technol. Corp., Tokyo, Japan ; Shimizu, T. ; Yamamoto, Y. ; Lee, G.H.
more authors

By applying an optical near field technique, the two-dimensional identification of optical properties and crystallinity in polycrystalline ZnO dots is obtained at room temperature for the first time.

Published in:

Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on  (Volume:1 )

Date of Conference:

15-19 July 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.