We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Optimization of trial functions in Finline structure modeling by the transverse resonance method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Khodja, A. ; Fac. of the Electr. Eng., Univ. USTHB, Algeria

The purpose of this article consists to establish an optimal choice of trial functions for the development of the transverse resonance method, using the formalism of mathematical operators applied to the electromagnetism, in order to analyze rigorously the scattering effect in the "Finline" structure with a minimum numerical effort

Published in:

Semiconductor Conference, 2001. CAS 2001 Proceedings. International  (Volume:2 )

Date of Conference:

Oct 2001