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Use of BIST in Sun FireTM servers

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3 Author(s)
Braden, J. ; Sun MicroSysterms Inc., Mountain View, CA, USA ; Lin, Q. ; Smith, B.

The latest UltraSPARCTM III generation of servers from Sun Microsystems makes extensive use of BIST and other DFT techniques to help improve test coverage and reduce test time during power-on self test. This paper is a case study which examines a number of different BIST techniques used in the Sun FireTM Midframe servers, and shows how they were combined to improve diagnosis of faults and overall system availability. Specific DFT techniques which are discussed include ASIC-based internal and external memory BIST, ASIC logic BIST, microprocessor-controlled interconnect test using IEEE 1149.1 boundary scan, and at-speed interconnect BIST tests across system buses

Published in:

Test Conference, 2001. Proceedings. International

Date of Conference:

2001