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A high-resolution jitter measurement technique using ADC sampling

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2 Author(s)
Cherubal, S. ; ARDEXT Technol., Atlanta, GA, USA ; Chatterjee, A.

In this paper, we propose a new technique for jitter measurement that can be implemented using commercially available, off-the-shelf components. The technique implements a high-resolution, high-speed, phase detector using a high-speed Analog-to-Digital Converter (ADC). The technique is shown to have high resolution and low test time compared to currently available techniques. Experimental results to demonstrate the effectiveness of the technique are presented

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Test Conference, 2001. Proceedings. International

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