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Propagation loss in single-mode GaAs-AlGaAs microring resonators: measurement and model

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4 Author(s)
Van, V. ; Dept. of Electr. & Comput. Eng., Maryland Univ., College Park, MD, USA ; Absil, P.P. ; Hryniewicz, J.V. ; Ho, P.-T.

We report propagation loss measurements in single-mode GaAs-AlGaAs racetrack microresonators with bending radii from 2.7 μm to 9.7 μm. The experimental data were found to be in good agreement with a physical-loss model which accounts for the bending loss, the scattering loss due to surface roughness on the waveguide sidewalls, and the transition loss at the straight-to-bend waveguide junctions. The model also enables us to identify the dominant loss mechanisms in semiconductor microcavities. We found that for racetracks with large bending radii (greater than 4 μm, in our case) the loss due to surface-roughness scattering in the curved waveguides dominates, whereas for small-radius rings, the modal mismatch at the straight-to-bend waveguide junctions causes the biggest loss. This result suggests that circular-shaped rings are preferable in the realization of ultrasmall low-loss microcavities. We also show that the round-trip propagation loss in small-radius racetrack microresonators can be minimized by introducing a lateral offset at the straight-to-bend waveguide junctions

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Lightwave Technology, Journal of  (Volume:19 ,  Issue: 11 )