By Topic

Complex permittivity measurements at Ka-Band using rectangular dielectric waveguide

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Z. Abbas ; Phys. Dept., Universiti Putra Malaysia, Serdang, Malaysia ; R. D. Pollard ; R. W. Kelsall

The rectangular dielectric waveguide (RDWG) technique has been developed for the determination of the dielectric constant of materials from effective refractive index measurements in the Q and W bands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured sample thickness is presented

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:50 ,  Issue: 5 )