By Topic

Static nonlinearity testing of digital-to-analog converters

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Vargha, B. ; Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Hungary ; Schoukens, Johan ; Rolain, Y.

The paper presents a diagnostic tool for analyzing the bit intermodulations in digital-to-analog converters (DACs). Bit intermodulations cause linearity errors which degrade the performance of the converter. A better understanding of these errors can lead to designing and building more accurate converters. Therefore, a new static nonlinear model is proposed to incorporate intermodulation errors. A linear transformation of the Walsh transform of the integrated nonlinearity diagram (INL) is shown to be sufficient to extract the bit intermodulation terms and their noise sensitivity. Practical applicability of the proposed method is shown by measurements performed on a custom-designed test circuit

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:50 ,  Issue: 5 )