By Topic

Managing, measuring and improving equipment capacity and overall equipment efficiency (OEE) using iPLUS

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Killeen, D. ; STMicroelectronics, Phoenix, AZ, USA ; Gaboury, P. ; Paccard, D.

STMicroelectronics has implemented the iPLUS system-Improved Productivity through Learning, Understanding and Solving-to introduce, measure, and finally improve overall equipment efficiency (OEE). The iPLUS system merges equipment information from the automation system with operator and lot information from the CAM system to calculate very precisely the availability efficiency, the rate efficiency and the equipment capacity. The measurements are done in real time and the feedback is directly given to the operators and engineers. This paper introduces the iPLUS system, discusses calculation of overall equipment efficiency, shows how we have implemented iPLUS in our fabs, details how each fab group uses iPLUS to manage productivity and discusses opportunities for improvement found using iPLUS

Published in:

Semiconductor Manufacturing Symposium, 2001 IEEE International

Date of Conference: