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Recent radiation damage and single event effect results for candidate spacecraft electronics

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19 Author(s)
M. V. O'Bryan ; Raytheon Inf. Technol. & Sci. Services, Lanham, MD, USA ; K. A. LaBel ; R. A. Reed ; R. L. Ladbury
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We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others

Published in:

Radiation Effects Data Workshop, 2001 IEEE

Date of Conference: