Cart (Loading....) | Create Account
Close category search window

Verifying data integrity of electronically scanned pressure systems at the NASA Glenn Research Center

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Panek, J.W. ; NASA Glenn Res. Center, Cleveland, OH, USA

The proper operation of the Electronically Scanned Pressure (ESP) Systems at the NASA Glenn Research Center is critical to accomplish the following goals; acquisition of highly accurate pressure data for the development of future aerospace and commercial aviation systems and continuous confirmation of data quality to avoid costly, unplanned, repeat wind tunnel or turbine testing. Standard automated setup and checkout routines are necessary to accomplish these goals. Data verification and integrity checks occur at three distinct stages, pre-test pressure tubing and system checkouts, daily system validation and in-test confirmation of critical system parameters. This paper will give an overview of the existing hardware, software and methods used to validate data integrity

Published in:

Instrumentation in Aerospace Simulation Facilities, 2001. 19th International Congress on ICIASF 2001

Date of Conference:

Aug 2001

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.