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Evaluation of Si(Li) detectors by a combination of the copper plating method and X-ray analytical microscopy

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4 Author(s)
H. Kume ; Nat. Inst. for Environ. Studies, Tsukuba, Japan ; H. Onabe ; M. Obinata ; T. Kashiwagi

Copper mapping for copper-plated lithium-ion compensated Si(Li) wafers was performed by a microbeam X-ray fluorescence method. Positional distribution of copper across a cross section of the Si(Li) wafers treated at 120°C for 20 h with no bias applied after complete compensation clearly showed deviation from those that did not undergo the thermal treatment. The surface-barrier detectors fabricated from the thermally treated wafers were found to have better energy resolution both for conversion electrons from 207Bi and for α-particles from 241Am. Correlation between the performance of the Si(Li) detectors and the lithium distribution in the intrinsic region was studied on the basis of the experimental results

Published in:

IEEE Transactions on Nuclear Science  (Volume:48 ,  Issue: 4 )