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Fault detection in a tristate system environment

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3 Author(s)

Embedded computers commonly rely on multiple-board systems, called tristate system environments. These environments consist of an interconnect and drivers or receivers with tristate features and boundary scan capabilities. The authors present a comprehensive fault model that provides 100 percent fault coverage and minimizes test set size

Published in:

Micro, IEEE  (Volume:21 ,  Issue: 5 )