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Test resource partitioning for SOCs

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2 Author(s)
Chandra, A. ; Duke Univ., Durham, NC, USA ; Chakrabarty, K.

A new test-resource-partitioning approach, based on test data compression and on-chip decompression, reduces data volume, decreases testing time, and accommodates slower (less expensive) testers without decreasing test duality

Published in:

Design & Test of Computers, IEEE  (Volume:18 ,  Issue: 5 )