By Topic

Ferrimagnetic resonance linewidths of thick barium hexaferrite films on MgO (111)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
S. D. Yoon ; Dept. of Electr. Eng., Northeastern Univ., Boston, MA, USA ; Ping Shi ; Xu Zuo ; S. A. Oliver
more authors

C-axis oriented barium hexaferrite films having thickness from 3-30 μm were deposited onto 0.5 mm magnesium oxide (MgO) (111) substrates by pulsed laser ablation deposition, and were characterized by magnetometry and ferrimagnetic resonance (FMR) measurements. The FMR linewidth for as-produced 30 μm films was 0.65-0.70 kOe, while those of thinner (3 μm) films was near 0.50 kOe. The narrowest linewidth of ~0.06 kOe was obtained for a 3 μm film after annealing for two hours. However, increased annealing time beyond two hours caused an increase in FMR linewidth. The FMR linewidth of 30 μm films where from 55-77% of the MgO substrate was removed decreased by 0.15-0.20 kOe compared to as-produced films. Further improvement in the FMR linewidth to 0.20 kOe was obtained by a two hour annealing. These FMR results are discussed in terms of the homogeneity, planar stress, and stoichiometry of these thick pulsed laser deposited films

Published in:

IEEE Transactions on Magnetics  (Volume:37 ,  Issue: 4 )