By Topic

Large volume thallium bromide detectors for gamma-ray spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Hitomi, K. ; Dept. of Electron., Tohoku Inst. of Technol., Sendai, Japan ; Muroi, O. ; Matsumoto, A. ; Shoji, T.
more authors

Thallium bromide (TlBr) is a wide bandgap compound semiconductor characterized with high photon stopping power. In this study large volume γ-ray detectors (approximately 3.8·3.8·3.8 mm 3) have been fabricated from the TlBr crystals grown by the horizontal travelling molten zone (TRIZ) method using zone-purified material. In order to extract the energy information of the incident radiation from the thick detectors the short charge collection time technique has been applied to the detectors. By this technique, the induced charge on the electrode is measured for the period of time short compared to the carrier transit time in order to minimize the deviation of the measured induced charge. The large volume TlBr detectors irradiated with 22Na and 137Cs isotopic sources at room temperature have exhibited good energy resolutions of 18.7% and 17.4% (FWHM) for the 511 and 662 keV peaks, respectively. To our knowledge, it is the first achievement that full-energy peaks with good energy resolutions have been obtained from TlBr detectors several mm thick. Time stability of the detector operation has been studied as well. Detailed discussions of the device operation are given

Published in:

Nuclear Science Symposium Conference Record, 2000 IEEE  (Volume:1 )

Date of Conference: