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Neural network-based L1-norm optimisation approach for fault diagnosis of nonlinear circuits with tolerance

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2 Author(s)
He, Y. ; Sch. of Electr. & Inf. Eng., Hunan Univ., Changsha, China ; Sun, Y.

The paper deals with fault isolation in nonlinear analogue circuits with tolerance under an insufficient number of independent voltage measurements. The L1-norm optimisation problem for different scenarios of nonlinear fault diagnosis is formulated with a new fast method being presented. How to solve the L1-norm optimisation problem is discussed and a new neural network-based approach for solving the nonlinear constrained L1-norm optimisation problem is proposed and utilised in locating the most likely faulty elements in nonlinear circuits. The validity of the proposed method is verified and simulation examples are presented

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Circuits, Devices and Systems, IEE Proceedings -  (Volume:148 ,  Issue: 4 )