Cart (Loading....) | Create Account
Close category search window
 

Soft errors in advanced semiconductor devices-part I: the three radiation sources

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Baumann, R.C. ; Silicon Technol. Dev. Group, Texas Instrum. Inc., Dallas, TX, USA

In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:1 ,  Issue: 1 )

Date of Publication:

Mar 2001

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.