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Soft errors in advanced semiconductor devices-part I: the three radiation sources

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1 Author(s)
Baumann, R.C. ; Silicon Technol. Dev. Group, Texas Instrum. Inc., Dallas, TX, USA

In this review paper, we summarize the key distinguishing characteristics and sources of the three primary radiation mechanisms responsible for inducing soft errors in semiconductor devices and discuss methods useful for reducing the impact of the effects in final packaged parts

Published in:

Device and Materials Reliability, IEEE Transactions on  (Volume:1 ,  Issue: 1 )