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Realistic fault models and test procedure for multi-port SRAMs

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4 Author(s)
Hamdioui, S. ; Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands ; van de Goor, A.J. ; Eastwick, D. ; Rodgers, M.

This paper presents realistic fault models for multi-port memories with p ports, based on defect injection and SPICE simulation. The results show that the fault models for p-port memories consist of p classes: single-port faults, two-port faults, ... , p-port faults. In addition, the paper discusses the test procedure for such memories. It shows that the time complexity of the required tests is not exponentially proportional with p, as published by different authors, but it is linear; irrespective of the number of ports the multi-port memory consists of

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Memory Technology, Design and Testing, IEEE International Workshop on, 2001.

Date of Conference: