By Topic

Uniform plasma model of shot noise in gyroklystrons

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
W. M. Manheimer ; Plasma Phys. Div., Naval Res. Lab., Washington, DC, USA

Theoretical estimates of electron cyclotron shot noise in gyroklystrons have recently been confirmed at low currents. However at high beam current, the noise temperature is always reduced. We examine the effect of transverse collective effects on the shot noise. There are two collective effects; shielding, which reduces the noise; and instability, which increases it. It is shown that the effect of transverse shielding is negligible unless the gyrotron beam is extremely cold. Regarding instability, if the bare shot noise amplitude is denoted Ξ, then the shot noise, including the effect of instability, can be expressed as Ξ(1+A exp Γ), where Γ is the integrated growth. The effect of instability is then measured by two parameters, Γ and A. For a cold gyrotron beam, A is about 0.3, meaning about 10 dB of power growth is needed for the instability to manifest itself. Thermal effects both reduce A and Γ. For realistic gyrotron beams, about 20-25 dB of power e folds would be necessary for instability to manifest itself. To summarize, the theory developed explains the absence of instability in the measurements, but indicates that phenomena other than transverse shielding are responsible for the noise reduction

Published in:

IEEE Transactions on Plasma Science  (Volume:29 ,  Issue: 4 )