Cart (Loading....) | Create Account
Close category search window

Fabric defect detection using adaptive wavelet

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yang Xue Zhi ; Dept. of Electr. & Electron. Eng., Hong Kong Univ., China ; Pang, G.K.H. ; Yung, N.H.C.

This paper studies the adaptive wavelet design for fabric defect detection. In order to achieve translation invariance and more flexible design, the wavelet design focuses on the nonsubsampled wavelet transform. We design the wavelet filters under the constraints that the analysis filters are power-complementary and the wavelet has only one vanishing moment, which corresponds to a multiscale edge detector. Based on lattice structure factorization, the design of the power-complementary filters turns out to be unconstrained optimization of lattice coefficients. Adaptive wavelets are designed for five kinds of fabric defects in the experiments. Comparing the proposed method with adaptive wavelet design for defect detection based on orthogonal wavelet transform energy between the defect area and the background, and achieve a robust and accurate detection of fabric defects

Published in:

Acoustics, Speech, and Signal Processing, 2001. Proceedings. (ICASSP '01). 2001 IEEE International Conference on  (Volume:6 )

Date of Conference:


Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.